In situ nanomechanical testing in focused ion beam and scanning electron microscopes

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In situ nanomechanical testing in focused ion beam and scanning electron microscopes.

The recent interest in size-dependent deformation of micro- and nanoscale materials has paralleled both technological miniaturization and advancements in imaging and small-scale mechanical testing methods. Here we describe a quantitative in situ nanomechanical testing approach adapted to a dual-beam focused ion beam and scanning electron microscope. A transducer based on a three-plate capacitor...

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ژورنال

عنوان ژورنال: Review of Scientific Instruments

سال: 2011

ISSN: 0034-6748,1089-7623

DOI: 10.1063/1.3595423